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12 篇文献
 
Yield enhancing defect tolerance techniques for FPGAs  
is expected to increase. This makes maintaining device yield a challenge. Also, it may be expected that more and more defect circuits will pass the production tests as the device testing challenge gro......
Field-Programmable Logic and Applications  2006
9次引用 0 0
Choose-your-own-adventure routing: lightweight load-time defect avoidance  
Aggressive scaling increases the number of devices we can integrate per square millimeter but makes it increasingly difficult to guarantee that each device fabricated has the intended operational char......
Symposium on Field Programmable Gate Arrays  2009
5次引用 0 0
Yield enhancements of design-specific FPGAs  
The high unit cost of FPGA devices often deters their use beyond the prototyping stage. Efforts have been made to reduce the part-cost of FPGA devices, resulting in the development of Design-Specific ......
Symposium on Field Programmable Gate Arrays  2006
4次引用 0 0
Evolving Redundant Structures for Reliable Circuits - Lessons Learned  
Fault tolerance is an increasing challenge for integrated circuits due to semiconductor technology scaling. This paper looks at how artificial evolution may be tuned to the creation of novel redundanc......
Adaptive Hardware and Systems  2007
5次引用 0 0
FPGA Defect Tolerance: Impact of Granularity  
As device sizes shrink, FPGAs are increasingly prone to manufacturing defects. The ability to tolerate multiple defects is anticipated to be very important at 45nm and beyond. One possible approach to......
IEEE International Conference on Field-Programmable Technology  2005
4次引用 0 0
Power-Efficient and Fault-Tolerant Circuits and Systems  
Abstract — As devices become smaller, circuits and systems are more vulnerable to soft errors caused by radiation and other environmental upsets. Fault tolerance measured by mean time to failure (MTTF......
0次引用 0 0
Reconfiguration and Fine-Grained Redundancy for Fault Tolerance in FPGAs  
As manufacturing technology enters the ultra-deep submicron era, wafer yields are destined to drop due to higher occurrence of physical defects on the die. This paper proposes a yield enhancement sche......
Field-Programmable Logic and Applications  2006
1次引用 0 0
FAULT TOLERANT FPGA USING REDUNDANT COLUMNS  
Fault tolerance techniques are important to increase the yield of the VLSI chips in advanced fabrication technologies. In regular structure like FPGA, redundancy is commonly used for fault tolerance. ......
0次引用 0 0
FPGA Architecture: Survey and Challenges  
Field-Programmable Gate Arrays (FPGAs) have become one of the key digital circuit implementation media over the last decade. A crucial part of their creation lies in their architecture, which governs ......
Foundations and Trends in Electronic Design Automation  2007
7次引用 0 0
Transistor-Level Defect Tolerant Digital System Design at the Nanoscale  
Abstract Nanotechnology-based fabrication is expected to offer the extra density and potential performance to take electronic circuits beyond the scaling limits reached by CMOS technology. Industrial ......
0次引用 0 0

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