IEEE Design and Test of Computers  - IEEE D&ToC

领  域:  硬件与体系结构
主  页:  http://www.computer.org/dt

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Looking ahead at the role of electronic design automation in synthetic biology [From the EIC]  
Krishnendu Chakrabarty
IEEE Design and Test of Computers  2012
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Test Technology TC Newsletter  
Partha Pratim Pande
IEEE Design and Test of Computers  2012
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Concurrent Device/Specification Cause–Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures  
Shyam Kumar Devarakond , Subhabrata Bapi Sen , Subhrajit Bhattacharya , Abhijit Chatterjee
IEEE Design and Test of Computers  2012
0次引用 0 0
Aging-Aware Power or Frequency Tuning With Predictive Fault Detection  
Jackson Pachito , Cleide Martins , B. Jacinto , Jorge Semiao , Julio Cesar Vazquez , Victor H. Champac , Marcelino Bicho Dos Santos , Isabel Maria Cacho Teixeira , Joao Paulo Teixeira
IEEE Design and Test of Computers  2012
0次引用 0 0
Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost  
Masahiro Ishida , Kiyotaka Ichiyama , Tasuku Fujibe , Watanabe, Daisuke , Masayuki Kawabata
IEEE Design and Test of Computers  2012
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Yervant Zorian
University of Southern California
 
Scott Davidson
 
Kwang-ting Cheng
AT Bell Labs., Murray Hill, NJ, USA
 
Rajesh Kumar Gupta
General Electric Company
 
Magdy S. Abadir
Freescale Semicond., Austin
 
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